Low Cost Test Pattern Generation in Scan-Based BIST Schemes
نویسندگان
چکیده
منابع مشابه
SCAN/BIST Techniques for Decreasing Test Storage and their implications to Test Pattern Generation
Test pattern storage is an important problem aaect-ing all Design for Testability (DfT) techniques based on scan-path. Built-In Self Test (BIST) methodologies are used in conjunction to scan-path techniques for reducing the amount of test patterns that must be stored. This paper analyzes two SCAN/BIST approaches and identiies conditions which guarantee that such techniques require shorter test ...
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The hardware overhead and fault coverage of a circuit is an important problem in integrated circuits and systems. To overcome this problem pseudorandom built-in-self-test (BIST) generators have been widely utilized to test integrated circuits and systems. A Pseudorandom pattern generator (PRPG) is used for generating test patterns (TPG). A weighted Pseudorandom built-in-self-test (BIST) schemes...
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ژورنال
عنوان ژورنال: Electronics
سال: 2019
ISSN: 2079-9292
DOI: 10.3390/electronics8030314